High-resolution transmission electron microscopy: Difference between revisions

The phase [[contrast transfer function]] is a function of limiting apertures and [[Aberration in optical systems|aberrations]] in the imaging lenses of a microscope. It describes their effect on the phase of the exit wave ''φ_e('''x''','''u''')'' and propagates it to the image wave. Following ''Williams and Carter'',<ref>{{cite book |title=Transmission electron microscopy: A textbook for materials science |last=Williams |first=David B. |author2=Carter, C. Barry |year=1996 |publisher=Plenum Press |location=New York |isbn=978-0-306-45324-3 |url-access=registration |url=https://archive.org/details/transmissionelec0002will }}</ref> if we{{who?|date=December 2020}} assume the weak phase object approximation holds (thin sample), then the contrast transfer function becomes