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'''High-resolution transmission electron microscopy''' ('''HRTEM''') or (HREM) is an imaging mode of the [[transmission electron microscope]] (TEM) that allows for direct imaging of the atomic structure of the sample.<ref>{{cite book |title=Experimental high-resolution electron microscopy |last=Spence |first=John C. H | authorlink = John C. H. Spence |year=1988 |origyear=1980 |publisher=Oxford U. Press |location=New York |isbn=0-19-505405-9 }}</ref><ref>{{cite journal|last1=Spence|first1=J. C. H.|authorlink1 = John C. H. Spence|last2=et al.|title=Imaging dislocation cores - the way forward|journal=Philos. Mag.|date=2006|volume=86|page=4781|doi=10.1080/14786430600776322|bibcode = 2006PMag...86.4781S }}</ref> HRTEM is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp<sup>2</sup>-bonded carbon (e.g. graphene, C nanotubes). While HRTEM is often also used to refer to high resolution scanning TEM (STEM, mostly in high angle annular dark field mode), this article describes mainly the imaging of an object by recording the 2D spatial wave amplitude distribution in the image plane, in analogy to a "classic" light microscope. For disambiguation, the technique is also often referred to as phase contrast TEM. At present, the highest point resolution realised in phase contrast TEM is around {{convert|0.5|Å|nm|3|lk=on}}.<ref>{{cite journal |author= C. Kisielowski, B. Freitag, M. Bischoff, H. van Lin, S. Lazar, G. Knippels, P. Tiemeijer, M. van der Stam, S. von Harrach, M. Stekelenburg, M. Haider, H. Muller, P. Hartel, B. Kabius, D. Miller, I. Petrov, E. Olson, T. Donchev, E. A. Kenik, A. Lupini, J. Bentley, S. Pennycook, A. M. Minor, A. K. Schmid, T. Duden, V. Radmilovic, Q. Ramasse, R. Erni, M. Watanabe, E. Stach, P. Denes, U. Dahmen | year=2008 |title= Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscopy with 0.5 Å information limit
|journal= Microscopy and Microanalysis |volume=14 |pages=469–477 |doi=10.1017/S1431927608080902 }}</ref> At these small scales, individual atoms of a crystal and [[Crystal defect|its defects]] can be resolved. For 3-dimensional crystals, it may be necessary to combine several views, taken from different angles, into a 3D map. This technique is called [[electron crystallography]].
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