File:B-gf-crosssectionsemizm.png
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Summary
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English: Microscopic cross sectional SEM images of glass frit bonded silicon wafers from Fraunhofer IZM. |
| Date | |
| Source | M. Petzold and C. Dresbach and M. Ebert and J. Bagdahn and M. Wiemer and K. Glien and J. Graf and R. Müller-Fiedler and H. Höfer, Fracture mechanical life-time investigation of glass frit-bonded sensors (2006) |
| Author | Uploaded by Enaswiki at en.wikipedia |
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- 2011-03-30 11:34 (UTC) | Enaswiki | 292263 (bytes) | 1501×1164 | {{Information |Description = Microscopic cross sectional SEM images of glass frit bonded silicon wafers from Fraunhofer IZM. |Source = M. Petzold and C. Dresbach and M. Ebert and J. Bagdahn and M. Wiemer and K. Glien and J. Graf and R. Mülle
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| current | 12:28, 27 December 2011 | 1,501 × 1,164 (285 KB) | SreeBot (talk | contribs) | (Original text) : {{Information |Description = Microscopic cross sectional SEM images of glass frit bonded silicon wafers from Fraunhofer IZM. |Source = M. Petzold and C. Dresbach and M. Ebert and J. Bagdahn and M. Wiemer and K. Glien and J. |
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