El Aabbaoui et al., 2005 - Google Patents
Design of a fully HBT 40GS/s sampling circuit for very large bandwidth non repetitive signal analysisEl Aabbaoui et al., 2005
- Document ID
- 10378229728513412192
- Author
- El Aabbaoui H
- Rolland N
- Benlarbi-Delai A
- Fel N
- Allouche V
- Leclerc P
- Riondet B
- Rolland P
- Publication year
- Publication venue
- IEEE MTT-S International Microwave Symposium Digest, 2005.
External Links
Snippet
The design of a fully heterojunction bipolar transistor (HBT) circuit allowing 20GHz bandwidth random signal sampling and the experimental results of the basic circuits are discussed. Assuming a temporal analysis depth of 5ns, this circuit, based on the principle of …
- 238000005070 sampling 0 title abstract description 30
Classifications
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/189—High frequency amplifiers, e.g. radio frequency amplifiers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
- G11C27/02—Sample-and-hold arrangements
- G11C27/024—Sample-and-hold arrangements using a capacitive memory element
- G11C27/026—Sample-and-hold arrangements using a capacitive memory element associated with an amplifier
-
- H—ELECTRICITY
- H03—BASIC ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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