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Raoult et al., 2015 - Google Patents

Electromagnetic coupling circuit model of a magnetic near-field probe to a microstrip line

Raoult et al., 2015

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Document ID
2836011933528321085
Author
Raoult J
Payet P
Omarouayache R
Chusseau L
Publication year
Publication venue
2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

External Links

Snippet

Electromagnetic (EM) injection experiments require an accurate and quantitative knowledge of the voltage effectively coupled to a target line or circuit in order to predict disruptive behavior or sensitivity of digital IC circuits to EM threats. To answer this question we derive …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
    • G06F—ELECTRICAL DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G06F17/5036—Computer-aided design using simulation for analog modelling, e.g. for circuits, spice programme, direct methods, relaxation methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing

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