CN113671292A

CN113671292A - Equipment testing method, system, device, electronic equipment and storage medium

Info

Publication number: CN113671292A
Application number: CN202110972660.6A
Authority: CN
Inventors: 储铜江; 张启益
Original assignee: Suzhou Ouqing Electronics Co ltd
Current assignee: Suzhou Ouqing Electronics Co ltd
Priority date: 2021-08-24
Filing date: 2021-08-24
Publication date: 2021-11-19
Anticipated expiration: 2041-08-24

Abstract

The embodiment of the invention discloses a device testing method, a system, a device, electronic equipment and a storage medium. The equipment testing method comprises the following steps: determining at least one test item of a plurality of devices under test; determining the dislocation test sequence of the test items of each device to be tested under the condition that each test item is determined to be a first test item; the test items of the equipment to be tested in the same staggered test sequence are different; and carrying out dislocation test on the test items of the equipment to be tested according to the dislocation test sequence. The technical scheme of the embodiment of the invention can improve the test efficiency of the equipment.

Description

Equipment testing method, system, device, electronic equipment and storage medium

Technical Field

The embodiment of the invention relates to the technical field of full-automatic testing, in particular to a device testing method, a system, a device, electronic equipment and a storage medium.

Background

With the development of science and technology, the functions of electronic equipment used by people in daily life are more and more complete, and a large amount of new technologies are applied to the production and research of the electronic equipment according to the requirements of different customers. However, the complexity of the manufacturing integration of the electronic device is higher and higher due to the abundance of the functions of the electronic device, and under the condition that the functions of the electronic device are continuously updated, in order to ensure that the electronic device meets the quality requirements of customers when leaving a factory, manufacturers of the electronic device hope to find out faulty products in time and reduce customer complaints. Because the manufacturing integration complexity of the electronic equipment is higher, the matched factory test requirement is correspondingly higher, and the test procedure is more complicated, so that the existing electronic equipment with the higher manufacturing integration complexity consumes a large amount of manpower and material resources during testing.

In the prior art, a single function of a device under test is mainly tested through a test station (equivalent to an independent test system), and when a plurality of functions of the device under test have test requirements, the device under test needs to be placed in different test stations for function testing. When a plurality of devices to be tested have test requirements, a plurality of test stations are also needed to complete the test task. Moreover, the operation and the test of the device to be tested are generally completed manually by an operator, so that the problem of low test efficiency cannot be avoided. The operation steps of the test station are explained by taking the device to be tested as a remote controller: in order to ensure the normal radio frequency performance of the remote controller, a radio frequency test station is used for carrying out radio frequency signal strength test and radio frequency signal frequency offset test on the remote controller. The testing steps of the radio frequency testing station are as follows: placing the remote controller into a test fixture, scanning a product bar code, enabling the remote controller to enter a test mode, pressing a key to enable the remote controller to emit a radio frequency signal, measuring a radio frequency signal performance parameter and taking out the remote controller. In order to ensure the normal voice performance of the remote controller, the voice performance test station is utilized to detect the possible abnormal situations of packet loss, noise, inflexion and the like in the voice communication process of the remote controller. The general test procedure is: the method comprises the steps of placing a remote controller into a test fixture, scanning a product bar code, enabling the remote controller to enter a test mode, opening a voice shielding box, pairing the remote controller with an upper computer through Bluetooth, recording, analyzing voice performance, stopping recording, closing the voice shielding box and taking out the remote controller. When pairing for guaranteeing the bluetooth, the performance of bee calling organ and LED lamp, pair the bluetooth through multi-functional test station, the performance of bee calling organ and LED lamp is tested, and general test procedure is: the method comprises the steps of placing a remote controller into a test fixture, scanning a product bar code, enabling the remote controller to enter a test mode, manually enabling the remote controller to start corresponding functional modules (Bluetooth pairing, buzzer sounding and LED lamp flickering) according to operation instructions, testing each functional module and taking out the remote controller. When testing different functions of a plurality of remote controllers, a plurality of test stations are needed to complete the test task, and the operation and the test of the remote controllers are manually completed by operators, so that the problem of low test efficiency cannot be avoided.

Disclosure of Invention

The embodiment of the invention provides a device testing method, a system, a device, electronic equipment and a storage medium, which can improve the testing efficiency of the equipment.

In a first aspect, an embodiment of the present invention provides an apparatus testing method, including:

determining at least one test item of a plurality of devices under test;

determining the dislocation test sequence of the test items of each device to be tested under the condition that each test item is determined to be a first test item; the test items of the equipment to be tested in the same staggered test sequence are different;

and carrying out dislocation test on the test items of the equipment to be tested according to the dislocation test sequence.

In a second aspect, an embodiment of the present invention provides an apparatus testing system, including a central control module and a target testing module, where:

the central control module is in communication connection with the target test module and is used for determining at least one test item of the plurality of devices to be tested; determining the dislocation test sequence of the test items of each device to be tested under the condition that each test item is determined to be a first test item; the test items of the equipment to be tested in the same staggered test sequence are different;

and the target test module is used for carrying out dislocation test on the test items of the equipment to be tested according to the dislocation test sequence.

In a third aspect, an embodiment of the present invention further provides an apparatus for testing a device, including:

the test item determining module is used for determining at least one test item of the plurality of devices to be tested;

the staggered test sequence determining module is used for determining the staggered test sequence of the test items of each device to be tested under the condition that each test item is determined to be the first test item; the test items of the equipment to be tested in the same staggered test sequence are different;

and the dislocation testing module is used for performing dislocation testing on the testing items of the equipment to be tested according to the dislocation testing sequence.

In a fourth aspect, an embodiment of the present invention further provides an electronic device, where the electronic device includes:

one or more processors;

storage means for storing one or more programs;

when the one or more programs are executed by the one or more processors, the one or more processors are caused to implement the device testing method provided by any embodiment of the invention.

In a fifth aspect, an embodiment of the present invention further provides a computer storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the device testing method provided in any embodiment of the present invention.

According to the technical scheme, the equipment testing system further determines the dislocation testing sequence of the testing items of the equipment to be tested by determining at least one testing item of the equipment to be tested and under the condition that the testing items are determined to be the first testing item, and then conducts dislocation testing on the testing items of the equipment to be tested according to the dislocation testing sequence. And the test items of the equipment to be tested in the same staggered test sequence are different. Under the condition that the test items of the multiple devices to be tested, which are simultaneously acquired by the device test system, are first test items, the device test system can test different test items of the multiple devices to be tested in the same test sequence, and the device test system tests different test items of the multiple devices to be tested at one time, so that compared with the mode that different test items of the multiple devices to be tested are respectively tested, the device test time can be greatly shortened, the problem of low device test efficiency existing in the prior art when the test items of the multiple devices to be tested are tested through different test stations is solved, and the device test efficiency can be improved.

Drawings

Fig. 1 is a flowchart of a device testing method according to an embodiment of the present invention;

fig. 2 is a flowchart of a device testing method according to a second embodiment of the present invention;

fig. 3 is a schematic diagram of an apparatus testing system according to a third embodiment of the present invention;

fig. 4 is a schematic hardware configuration diagram of an apparatus testing system according to a third embodiment of the present invention;

fig. 5 is a schematic diagram illustrating positions of a remote controller and an artificial mouth according to a third embodiment of the present invention;

fig. 6 is a schematic diagram of a placement position of a remote controller according to a third embodiment of the present invention;

fig. 7 is a comparison diagram of a testing method of an apparatus testing system according to a third embodiment of the present invention and a conventional testing method;

fig. 8 is a schematic diagram of a multifunctional test performed by two remote controllers according to a third embodiment of the present invention;

FIG. 9 is a schematic diagram of an apparatus testing device according to a fourth embodiment of the present invention;

fig. 10 is a schematic structural diagram of an electronic device according to a fifth embodiment of the present invention.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention.

It should be further noted that, for the convenience of description, only some but not all of the relevant aspects of the present invention are shown in the drawings. Before discussing exemplary embodiments in more detail, it should be noted that some exemplary embodiments are described as processes or methods depicted as flowcharts. Although a flowchart may describe the operations (or steps) as a sequential process, many of the operations can be performed in parallel, concurrently or simultaneously. In addition, the order of the operations may be re-arranged. The process may be terminated when its operations are completed, but may have additional steps not included in the figure. The processes may correspond to methods, functions, procedures, subroutines, and the like.

Example one

Fig. 1 is a flowchart of a device testing method according to an embodiment of the present invention, where the embodiment is applicable to the case of efficiently testing devices, the method may be applied to a device testing system, and may also be executed by a device testing apparatus, and the system and the apparatus may be implemented by software and/or hardware, and may be generally integrated in an electronic device. Accordingly, as shown in fig. 1, the method comprises the following operations:

s110, determining at least one test item of the plurality of devices to be tested.

The device to be tested can be any device which needs to be subjected to function testing. Alternatively, the test device may include a hardware device, a software device, and the like. The test items may be functions that the device under test needs to test.

In the embodiment of the invention, when a plurality of devices to be tested need to be subjected to function testing, the device testing system can determine at least one testing item of the plurality of devices to be tested according to the testing requirement of the devices to be tested. Wherein, the test items of the devices under test can be the same or different.

And S120, determining the staggered test sequence of the test items of the equipment to be tested under the condition that the test items are determined to be the first test items.

The first test item can be a test item which needs to be tested by the device testing system in a time-sharing manner. The staggered test sequence can be a test sequence for the time-sharing test of the test items of each device to be tested by the device test system, and is used for time-sharing test of the test items of each device to be tested according to the sequence. It should be noted that the test items of the devices under test in the same staggered test sequence are different.

In the embodiment of the present invention, if the device test system cannot assign the same test order to each of the same test items according to the same test item of the multiple devices under test, it may be determined that each test item is the first test item. Under the condition that each test item is determined to be the first test item, a corresponding test sequence can be allocated to the test items in each device to be tested, so that a staggered test sequence of the test items of each device to be tested is obtained.

For example, it is assumed that the device under test includes a device under test 1 and a device under test 2, the test items of the device under test 1 are a test item 1, a test item 2, and a test item 3, and the test items of the device under test 2 are a test item 1, a test item 2, and a test item 4, respectively. If the device testing system cannot allocate the same testing sequence to the same testing items in the device to be tested 1 and the device to be tested 2, the testing items of the device to be tested 1 and the device to be tested 2 can be determined to be the first testing item, and then the testing sequence can be allocated to the testing items of the device to be tested 1, so that the testing sequence of the testing items of the device to be tested 2 is determined according to the testing sequence of the testing items of the device to be tested 1, and the testing sequences of the testing items of the device to be tested 2 and the device to be tested 1 are different. For example, the test sequence of the test items of the device under test 1 may be test item 1, test item 2, and test item 3, and the test sequence of the test items of the device under test 2 may be test item 2, test item 1, and test item 4. It can be understood that, the test sequence may also be first assigned to the test items of the device under test 2, and then the test sequence of the test items of the device under test 1 may be determined according to the test sequence of the test items of the device under test 2. The test sequence of the test items of the device under test 1 is not limited in the embodiment of the present invention, and the test sequence of the same test items of the device under test 2 is different.

And S130, carrying out dislocation test on the test items of the equipment to be tested according to the dislocation test sequence.

The dislocation test can be used for testing the test items of the devices to be tested according to the dislocation test sequence.

In the embodiment of the invention, the test items of the devices to be tested in the same dislocation test sequence can be determined according to the dislocation test sequence, the test items belonging to the same dislocation test sequence can be tested according to the dislocation test sequence, and the test items in different dislocation test sequences can be tested in batches in sequence until all the test items of the devices to be tested finish testing.

Continuing with the above example as an example, first, the test items of the device under test 1 and the device under test 2 in the first test order may be determined, and then the test item 1 of the device under test 1 and the test item 2 of the device under test 2 in the first test order may be tested at the same time. When the test items of the device to be tested 1 and the device to be tested 2 in the first test sequence are tested, the test items of the device to be tested 1 and the device to be tested 2 in the second test sequence can be further determined, and then the test items of the device to be tested 1 and the test items of the device to be tested 2 in the second test sequence are tested simultaneously. When the test items of the device to be tested 1 and the device to be tested 2 in the second test sequence are tested, the test items of the device to be tested 1 and the device to be tested 2 in the third test sequence can be determined, and then the test item 3 of the device to be tested 1 and the test item 4 of the device to be tested 2 in the third test sequence are tested simultaneously.

Example two

Fig. 2 is a flowchart of an apparatus testing method according to a second embodiment of the present invention, which is embodied on the basis of the second embodiment, and in this embodiment, a specific optional implementation scheme is provided for determining that a test item is a first test item, further determining a staggered test order of the test items of each device under test, performing a staggered test on the test items of each device under test according to the staggered test order, determining that the test items are second test items, further determining a synchronous test order of the test items of each device under test, and performing a synchronous test on the test items of each device under test according to the synchronous test order. Accordingly, as shown in fig. 2, the method includes the following operations:

s210, determining at least one test item of the plurality of devices to be tested.

And S220, under the condition that each test item is determined to be the first test item, determining basic synchronous test items included in a basic test link of the equipment to be tested, and distributing a basic synchronous test sequence for the basic synchronous test items.

The basic test link can be a link of the device test system enabling the device to be tested to enter a test state, and is equivalent to a preparation link of the device test system before testing the device to be tested. The basic synchronization test item may be a test item unrelated to a test requirement of the device under test, for bringing the plurality of devices under test into a test state. The basic synchronous test sequence may be a test sequence of basic synchronous test items of a plurality of devices to be tested, and test items of the devices to be tested in the same basic synchronous test sequence are the same.

In the prior art, one test system can only test a single function of one device to be tested at a time, which results in that the same device to be tested needs to repeatedly test basic synchronous test items before testing different test systems, and the same device to be tested is repeatedly tested on the basic synchronous test items, so that the existing test system has the problem of low device test efficiency.

In the embodiment of the present invention, if the test item of the multiple devices to be tested is the first test item, the basic test link of the devices to be tested may be further determined according to the configuration condition of the device test system, so as to obtain the basic synchronous test item included in the basic test link. And after the basic synchronous test items included in the basic test link are obtained, distributing a basic synchronous test sequence for the basic synchronous test items based on the step that the equipment to be tested enters the test state.

The equipment testing system in the embodiment of the invention only needs to test each piece of equipment to be tested for a round of basic synchronous testing items, namely, the equipment testing system does not need to test the basic synchronous testing items of the equipment to be tested again before testing different testing items of the same equipment to be tested. Therefore, the equipment testing system in the embodiment of the invention can avoid repeated testing of basic synchronous testing items of the same equipment to be tested, solves the problem of low equipment testing efficiency caused by repeated operation in the prior art, and improves the equipment testing efficiency.

In an optional embodiment of the present invention, determining each test item as a first test item may include: determining the type of the synchronous test item according to the local configuration data; in the event that it is determined that the test item does not completely match the synchronous test item type, the test item is determined to be the first test item.

The local configuration data may be used to characterize the configuration of the device testing system. The local configuration data may include a category of locally configured target test modules and a number of each target test module. The target test module may be a component of a device test system for testing test items of a device under test. The class of the target test module may be a type of the target test module provided in the device test system. The synchronous test item type may be a type of at least one identical test item of a plurality of devices under test that the device test system is capable of testing simultaneously. For example, taking the device under test as a remote controller as an example, the test items included in the synchronous test item type may include a voice function test, a signal lamp function test, and the like. For example, the voice function test may include a test of a recording function of the device to be tested, and a test of a function of playing audio by the device to be tested. The signal lamp function test can be a test for judging whether the signal lamp of the equipment to be tested works normally.

In the embodiment of the present invention, the local configuration data of the device test system may be determined according to the configuration condition of the device test system, and then the local configuration data is analyzed to obtain the type of the target test modules configured locally by the device test system and the number of each target test module, and further, the type of at least one same test item of the multiple devices to be tested, which can be tested simultaneously by the device test system, is determined according to the type of the target test modules configured locally and the number of each target test module, so as to obtain the type of the synchronous test item. And matching the test items of the plurality of devices to be tested with the synchronous test item types, and if the test items of the plurality of devices to be tested comprise test items other than the synchronous test item types, determining that the test items are not completely matched with the synchronous test item types. When the test items of the multiple devices to be tested include test items other than the synchronous test item type, the device test system cannot allocate the same test sequence to each of the same test items according to the same test items of the multiple devices to be tested, so that the test items and the synchronous test item type can be incompletely matched as a judgment basis for the test item being the first test item. Therefore, in the case where the test item does not completely match the synchronous test item type, it can be determined that the test items of the plurality of devices under test belong to the first test item.

In an optional embodiment of the present invention, the device testing method may further include: under the condition that the types of the test items and the synchronous test items are completely matched, determining that the test items of the equipment to be tested are second test items; determining a synchronous test sequence of test items of equipment to be tested; and synchronously testing the test items of the equipment to be tested according to the synchronous test sequence.

The second test item may be the same test item of a plurality of devices under test that the device test system can test simultaneously. The synchronous test sequence may be a test sequence of at least one same test item that the device test system is capable of testing a plurality of devices under test simultaneously.

In the embodiment of the present invention, at least one test item of the multiple devices to be tested may be matched with the synchronous test item type, and if the test items of the multiple devices to be tested do not include a test item other than the synchronous test item type, it is determined that the test item is completely matched with the synchronous test item type. When the test items of the multiple devices to be tested do not include the test items other than the synchronous test item type, the device test system may assign the same test sequence to each of the same test items according to the same test items of the multiple devices to be tested, so that the test items and the synchronous test item types may be completely matched as a criterion for determining that each test item is the second test item, and therefore, the test items of the devices to be tested may be used as the second test items when it is determined that the test items and the synchronous test item types are completely matched. Under the condition that the test item of the device to be tested is determined to be the second test item, a synchronous test sequence can be configured for the test item of the device to be tested, so that at least one same test item of the multiple devices to be tested can be synchronously tested according to the synchronous test sequence, namely the test items of different devices to be tested in the same synchronous test sequence are the same.

For example, it is assumed that the test items of the device under test 1 are test item 1 and test item 2, the test items of the device under test 2 are test item 1 and test item 2, and the synchronous test item types include test items 1, test item 2, and test item 3. Since it is assumed that the test items of the device under test 1 and the device under test 2 both exist in the test items included in the synchronous test item type (the test items are completely matched with the synchronous test item type), the device test system may assign the same test order to the same test items of the device under test 1 and the device under test 2. For example, a first test order may be assigned to test item 1 of device under test 1 and test item 1 of device under test 2, and a second test order may be assigned to test item 2 of device under test 1 and test item 2 of device under test 2. That is, the device testing system may first test the test item 1 of the device under test 1 and the test item 1 of the device under test 2 at the same time, and after the test items of the first test sequence are completed, test the test item 2 of the device under test 1 and the test item 2 of the device under test 2. The embodiment of the invention does not limit the test sequence of the same test items of the device to be tested 1 and the device to be tested 2.

And S230, determining test items included in the non-basic test link of the equipment to be tested, and distributing a staggered test sequence for the test items included in the non-basic test link according to the basic synchronous test sequence.

The non-basic testing link can be the next link that the equipment testing system needs to enter after the basic testing link, and is equivalent to a link that the equipment testing system tests the testing items of the equipment to be tested, that is, the non-basic testing link can specifically test one or more functions of the equipment to be tested.

In the embodiment of the invention, if the basic synchronous test sequence is obtained, the characterization equipment test system can enter a non-basic test link, the equipment test system can further obtain the test items to be tested in the non-basic test link, and then can distribute the dislocation test sequence for the test items included in the non-basic test link after the basic synchronous test sequence.

In an optional embodiment of the present invention, after assigning the staggered test sequence to the test items included in the non-basic test link according to the basic synchronous test sequence, the method may further include: sending a low-voltage signal to the device to be tested through the GPIO pin so as to enable the device to be tested to enter a test state; and sending a test starting signal to the equipment to be tested according to the staggered test sequence in a UART communication mode so as to enable the test items of the equipment to be tested to enter a test state.

The test start signal may be a signal sent by the device test system to the device to be tested, and is used to enable the test item of the device to be tested to enter the test state.

In the embodiment of the invention, after the staggered test sequence is distributed to the test items included in the non-basic test link according to the basic synchronous test sequence, the potential of the local GPIO pin can be pulled down, and the low-voltage signal is sent to the device to be tested through the GPIO pin, so that the device to be tested enters the test state. After the device to be tested enters the test state, the device test system may further send a test start signal to the device to be tested in a staggered test order through a UART manner, and the device to be tested determines the test items associated with the test start signal, so that the test items associated with the test start signal enter the test state. The low-voltage signal sent to the device to be tested through the GPIO pin can be used as a sub-link in a basic testing link, and the test starting signal sent to the device to be tested through the UART communication mode according to a staggered testing sequence can be used as a sub-link in a non-basic testing link.

At present, mainly make the equipment to be tested get into test state through manual mode, if every equipment to be tested all gets into test state through manual mode, then the efficiency that a plurality of equipment to be tested got into test state can be lower, and the problem that manually makes the equipment to be tested get into test state leads to the maloperation very easily, this scheme makes the equipment to be tested get into test state through the mode that GPIO pin sent low-voltage signal to the equipment to be tested, can improve the efficiency that a plurality of equipment to be tested get into test state, can also avoid the problem of maloperation simultaneously. In addition, the equipment testing system avoids sending the test starting signal to the multiple devices to be tested in a Bluetooth communication mode, and sends the test starting signal to the multiple devices to be tested in a UART communication mode, so that the process of Bluetooth pairing of the equipment testing system and the multiple devices to be tested is omitted, and the communication reliability of the equipment testing system and the devices to be tested can be improved.

And S240, carrying out dislocation test on the test items of the equipment to be tested according to the dislocation test sequence.

In an alternative embodiment of the invention, the device under test may comprise a remote control. Optionally, the device to be tested may further include an intelligent bracelet, an intelligent electric lamp, and the like, and the embodiment of the present invention defines the specific device type of the device to be tested.

According to the technical scheme, the equipment testing system further determines basic synchronous testing items included in a basic testing link of the equipment to be tested by determining at least one testing item of the plurality of equipment to be tested and distributing basic synchronous testing sequences for the basic synchronous testing items under the condition that each testing item is determined to be a first testing item, so that testing items included in a non-basic testing link of the equipment to be tested are determined, and staggered testing sequences are distributed for the testing items included in the non-basic testing link according to the basic synchronous testing sequences. After the dislocation test sequence is obtained, the test items of each device to be tested can be subjected to dislocation test according to the dislocation test sequence. Under the condition that the test items of the multiple devices to be tested, which are simultaneously acquired by the device test system, are first test items, the device test system can test different test items of the multiple devices to be tested in the same test sequence, and the device test system tests different test items of the multiple devices to be tested at one time, so that compared with the mode that different test items of the multiple devices to be tested are respectively tested, the device test time can be greatly shortened, the problem of low device test efficiency existing in the prior art when the test items of the multiple devices to be tested are tested through different test stations is solved, and the device test efficiency can be improved.

It should be noted that any permutation and combination between the technical features in the above embodiments also belong to the scope of the present invention.

EXAMPLE III

Fig. 3 is a schematic diagram of a device testing system according to a third embodiment of the present invention, where the structure of the device testing system includes: the system comprises a central control module 310 and a target test module 320, wherein the central control module 310 is in communication connection with the target test module 320 and is used for determining at least one test item of a plurality of devices to be tested; determining the dislocation test sequence of the test items of each device to be tested under the condition that each test item is determined to be a first test item; the test items of the equipment to be tested in the same staggered test sequence are different; and the target testing module 320 is configured to perform a misalignment test on the test items of each device under test according to the misalignment testing order.

The central control module 310 may be a control center of the device testing system. The target test module 320 may be a device capable of testing a test item of a device under test.

In this embodiment of the present invention, when a plurality of devices under test need to perform a function test, the central control module 310 of the device testing system may determine at least one test item of the plurality of devices under test according to a test requirement of the devices under test. If the central control module 310 of the device testing system cannot assign the same testing sequence to each of the same testing items according to the same testing items of the multiple devices under test, it may be determined that each testing item is the first testing item. Under the condition that each test item is determined to be the first test item, the central control module 310 may assign a test sequence to the test items in each device under test, so as to obtain a staggered test sequence of the test items of each device under test. After obtaining the staggered test order, the central control module 310 may send a test signal to the target test module 320 according to the staggered test order, so that the target test module 320 may receive the test signal according to the staggered test order and perform staggered test on the test items of each device under test according to the staggered test order.

Optionally, the central control module 310 is specifically configured to: determining the type of the synchronous test item according to the local configuration data; wherein the local configuration data comprises a category of locally configured target test modules and a number of each of the target test modules; determining the test item as the first test item if it is determined that the test item does not completely match the synchronous test item type.

Optionally, the central control module 310 is specifically configured to: determining the test item of the equipment to be tested as a second test item under the condition that the test item is completely matched with the synchronous test item type; determining a synchronous test sequence of the test items of the equipment to be tested; and synchronously testing the test items of the devices to be tested according to the synchronous test sequence.

Optionally, the central control module 310 is specifically configured to: determining basic synchronous test items included in a basic test link of the equipment to be tested, and distributing a basic synchronous test sequence for the basic synchronous test items; the test items of all the devices to be tested in the same basic synchronous test sequence are the same; and determining test items included in a non-basic test link of the equipment to be tested, and distributing a staggered test sequence for the test items included in the non-basic test link according to the basic synchronous test sequence.

Optionally, the central control module 310 is specifically configured to: sending a low-voltage signal to the device to be tested through a GPIO general input/output pin so as to enable the device to be tested to enter a test state; and sending a test starting signal to the equipment to be tested according to the dislocation test sequence through a UART universal asynchronous receiving and transmitting transmitter communication mode so as to enable the test items of the equipment to be tested to enter a test state.

Optionally, the device under test in any embodiment of the present invention includes a remote controller.

Illustratively, a central control module of the device testing system communicates with a remote controller in a UART communication mode to replace a traditional wireless Bluetooth communication mode, and the remote controller enters a testing state in a mode of pulling down the potential of a GPIO pin. Under the UART communication mode, the buzzer of the remote controller can be controlled to sound through the UART, so that the central control module can collect the sound emitted by the buzzer of the remote controller by using the microphone and analyze the collected sound by using the integrated sound card to judge whether the sound of the buzzer is normal or not; or after the buzzer of the remote controller is controlled to sound through the UART, the buzzer analyzer is used for analyzing the sound emitted by the buzzer of the remote controller so as to judge whether the sound emission of the buzzer is normal. Other test items of the remote controller can also be turned on and controlled through the UART, which is not described herein.

Fig. 4 is a schematic diagram of a hardware configuration of an apparatus testing system according to a third embodiment of the present invention, where the hardware configuration of the apparatus testing system may refer to fig. 4 when a device to be tested is a remote controller, and a central control module of the apparatus testing system may be a computer device. The target test module comprises a spectrum analyzer, a radio frequency antenna, an LED analyzer, a buzzer sound-emitting analyzer, a Bluetooth adapter, a simulation nozzle, a camera and a remote controller comprehensive tester. In order to ensure the accuracy of the test, the remote controller and part of the equipment testing system can be placed in a voice shielding box. Specifically, whether the remote controller and the target test module are installed in the voice shielding box can be determined according to actual requirements. As shown in fig. 4, the device testing system can simultaneously and respectively perform parallel tests on testing items of the plurality of remote controllers, such as the recording function, the LED function, the buzzer function, and the radio frequency function.

When the equipment to be tested is a remote controller, the equipment testing system can simultaneously perform recording test on a plurality of remote controllers. Before testing the recording functions of a plurality of remote controllers, a microphone of a central control module needs to be calibrated through one standard sound source sound generator to ensure that the microphone works normally, an effective value of the standard sound source is recorded to be used for subsequent simulation mouth calibration, then the calibrated microphone is used for calibrating the simulation mouth, and finally the calibrated simulation mouth can continuously generate sweep frequency sound of 150Hz to 7100 Hz. Specifically, a microphone of the central control module is calibrated by using a standard sound source sounder of 1Khz and 94dB, the corrected microphone measures the effective value of sound emitted by the simulation mouth in real time and reports the effective value to the central control module, and the central control module adjusts the sound emission range of the simulation mouth, so that the sound emitted by the simulation mouth from the full frequency band of 150Hz to 7100Hz is 94 dB.

When the equipment testing system tests the recording function of the remote controller, the recording function of the remote controller can be opened in a UART communication mode, then the sweep-frequency audio is played according to 94dB through the simulation mouth, the remote controller records the audio sent by the simulation mouth through the microphone, and the recorded data are sent to the central control module. The central control module decodes the recording data, further analyzes the decoded recording data in a Fourier fast change mode to obtain data such as frequency, signal to noise ratio and total harmonic distortion of the recording data, and further draws a response curve according to the frequency, the signal to noise ratio and the total harmonic distortion data of the recording data, so that whether the recording function of the remote controller is normal can be judged according to the response curve. The central control module may support decoding of multiple voice formats. For example, the central control module may support decoding of voice formats such as PCM (Pulse Code Modulation) format, ADPCM (Adaptive Differential Pulse Code Modulation) format, ATV (android television) format, mSBC (bluetooth audio coding) format, and GATT (Generic Attribute Profile, a bluetooth protocol). The frequency of the sweep frequency audio is selected according to 1/12 frequency multiplication, 68 frequency points are formed from 150Hz to 7100Hz, and each frequency point plays 30 ms.

Fig. 5 is a schematic diagram of positions of a remote controller and a simulation mouth according to a third embodiment of the present invention, where the remote controller shown in fig. 5 may be fixed by a test probe, placed above the simulation mouth, and communicatively connected to the remote controller and the simulation mouth. In order to ensure that the quality of the audio data received by each remote controller is the same, the remote controller can be placed around the simulated mouth within a certain radius by taking the simulated mouth as a center, and finally, the placement position of the remote controller can refer to fig. 6.

Fig. 7 is a comparison diagram of a testing method of an equipment testing system according to a third embodiment of the present invention and a conventional testing method, where a testing apparatus is taken as a remote controller, as shown in fig. 7, in the conventional testing method, the remote controller needs to perform tests of different functions at different testing stations, and it is assumed that the testing station 1 can perform a test of radio frequency performance of the remote controller, the testing station 2 can perform a test of bluetooth configuration function of the remote controller, and the testing station 3 can perform a test of a recording function of the remote controller. When the remote controller needs to test the radio frequency performance, the bluetooth matching function and the recording function, the following operations are required to be performed at the test station 1: placing a remote controller into a test fixture, scanning a product bar code, enabling the remote controller to enter a test mode, carrying out radio frequency test and taking out the remote controller; the following operations are required at the test station 2: placing a remote controller into a test fixture, scanning a product bar code, enabling the remote controller to enter a test mode, carrying out Bluetooth function test and taking out the remote controller; the following operations are required at the test station 3: placing the remote controller into a test fixture, scanning a product bar code, enabling the remote controller to enter a test mode, carrying out a recording test and taking out the remote controller. The equipment testing system (equivalent to a testing station) can complete the testing of a plurality of functions of the remote controller by the steps of placing the remote controller into the testing fixture, scanning the bar code of the product, enabling the remote controller to enter the testing mode, carrying out the radio frequency test, carrying out the Bluetooth function test, carrying out the recording test and taking out the remote controller, thereby reducing the repeated steps and improving the testing efficiency of the remote controller.

Fig. 8 is a schematic diagram of performing a multi-function test on two remote controllers according to a third embodiment of the present invention, as shown in fig. 8, when the remote controllers 1 and 2 need to test a radio frequency function, a buzzer function, and a recording function, the device test system may configure a staggered test sequence for the test items of the remote controllers 1 and 2, for example, the staggered test sequence of the remote controller 1 may be a radio frequency function test, a recording function test, and a buzzer function test. The staggered test sequence of the remote controller 2 can be a recording function test, a buzzer function test and a radio frequency function test. After the test sequence of the test items of the remote controller 1 and the remote controller 2 is determined, the remote controller 1 and the remote controller 2 can be placed into the test fixture by an operator, and the equipment test system further judges whether the remote controller 1 and the remote controller 2 are both placed into the test fixture set for the remote controller by the equipment test system. After the remote controller is determined to be located in the test fixture, an instruction can be sent to the camera head through the central control module, so that the camera head can automatically scan the product bar code of the remote controller, and then the remote controller 1 and the remote controller 2 are tested according to the dislocation test sequence. After all the test items of the two remote controllers are tested, the two remote controllers can be taken out of the test fixture. Since hardware costs of the buzzer tester for performing the buzzer function test and the radio frequency tester for performing the radio frequency function test are high, only one buzzer tester and one radio frequency tester need to be configured in the equipment test system. At present, two buzzer testers are needed when the buzzer functions of two remote controllers are tested simultaneously, but the invention carries out dislocation test on the same test items of the two remote controllers, can improve the test efficiency of the remote controllers and can also reduce the requirements on hardware equipment of an equipment test system.

It should be noted that all data transmission and test between the device test system and the remote controller can be performed directly through UART communication without additional bluetooth pairing, thereby improving communication efficiency, breaking through the limitation that the test device of the test station can only communicate with one remote controller at the same time, and supporting parallel communication with multiple remote controllers simultaneously. The equipment testing system is communicated with the remote controller and the target testing module through the central control module, and an operator does not need to manually access the remote controller during testing.

Example four

Fig. 9 is a schematic diagram of a device testing apparatus according to a fourth embodiment of the present invention, and as shown in fig. 9, the apparatus includes: a test item determination module 410, a misplacement test order determination module 420, and a misplacement test module 430, wherein:

a test item determination module 410 for determining at least one test item of a plurality of devices under test;

a misplaced test sequence determining module 420, configured to determine a misplaced test sequence of the test items of each device under test when each test item is determined to be a first test item; the test items of the equipment to be tested in the same staggered test sequence are different;

and the misalignment testing module 430 is configured to perform misalignment testing on the test items of each device under test according to the misalignment testing sequence.

Optionally, the misalignment testing order determining module 420 is specifically configured to: determining the type of the synchronous test item according to the local configuration data; wherein the local configuration data comprises a category of locally configured target test modules and a number of each of the target test modules; determining the test item as the first test item if it is determined that the test item does not completely match the synchronous test item type.

Optionally, the device testing apparatus further includes a synchronous testing module, configured to determine that the test item of the device under test is a second test item when it is determined that the test item is completely matched with the synchronous test item; determining a synchronous test sequence of the test items of the equipment to be tested; and synchronously testing the test items of the devices to be tested according to the synchronous test sequence.

Optionally, the misalignment testing order determining module 420 is specifically configured to: determining basic synchronous test items included in a basic test link of the equipment to be tested, and distributing a basic synchronous test sequence for the basic synchronous test items; the test items of all the devices to be tested in the same basic synchronous test sequence are the same; and determining test items included in a non-basic test link of the equipment to be tested, and distributing a staggered test sequence for the test items included in the non-basic test link according to the basic synchronous test sequence.

Optionally, the misalignment testing module 430 is specifically configured to: sending a low-voltage signal to the device to be tested through a GPIO general input/output pin so as to enable the device to be tested to enter a test state; and sending a test starting signal to the equipment to be tested according to the dislocation test sequence through a UART universal asynchronous receiving and transmitting transmitter communication mode so as to enable the test items of the equipment to be tested to enter a test state.

Optionally, the device to be tested according to any embodiment of the present invention includes a remote controller.

According to the technical scheme, the equipment testing system further determines the dislocation testing sequence of the testing items of the equipment to be tested by determining at least one testing item of the equipment to be tested and under the condition that the testing items are determined to be the first testing item, and then conducts dislocation testing on the testing items of the equipment to be tested according to the dislocation testing sequence. And the test items of the equipment to be tested in the same staggered test sequence are different. Under the condition that the test items of the multiple devices to be tested, which are simultaneously acquired by the device test system, are first test items, the device test system can test different test items of the multiple devices to be tested in the same test sequence, and the device test system tests different test items of the multiple devices to be tested at one time, so that compared with the mode that different test items of the multiple devices to be tested are respectively tested, the test time can be greatly shortened, the problem of low test efficiency when the test items of the multiple devices to be tested are tested through different test stations in the prior art is solved, and the test efficiency of the devices can be improved.

The device testing device can execute the device testing method provided by any embodiment of the invention, and has corresponding functional modules and beneficial effects of the execution method. For details of the apparatus testing method provided in any embodiment of the present invention, reference may be made to the technical details not described in detail in this embodiment.

Since the device testing apparatus described above is an apparatus capable of executing the device testing method in the embodiment of the present invention, based on the device testing method described in the embodiment of the present invention, a person skilled in the art can understand the specific implementation of the device testing apparatus in the embodiment and various variations thereof, and therefore, how the device testing apparatus implements the device testing method in the embodiment of the present invention is not described in detail herein. The apparatus used by those skilled in the art to implement the method for testing the device in the embodiment of the present invention is within the scope of the present application.

EXAMPLE five

Fig. 10 is a schematic structural diagram of an electronic device according to a fifth embodiment of the present invention. FIG. 10 illustrates a block diagram of an electronic device 512 that is suitable for use in implementing embodiments of the present invention. The electronic device 512 shown in fig. 10 is only an example and should not bring any limitations to the function and the scope of use of the embodiments of the present invention.

As shown in fig. 10, electronic device 512 is in the form of a general purpose computing device. Components of the electronic device 512 may include, but are not limited to: one or more processors 516, a storage device 528, and a bus 518 that couples the various system components including the storage device 528 and the processors 516.

Bus 518 represents one or more of any of several types of bus structures, including a memory bus or memory controller, a peripheral bus, an accelerated graphics port, and a processor or local bus using any of a variety of bus architectures. By way of example, such architectures include, but are not limited to, an Industry Standard Architecture (ISA) bus, a Micro Channel Architecture (MCA) bus, an enhanced ISA bus, a Video Electronics Standards Association (VESA) local bus, and a Peripheral Component Interconnect (PCI) bus.

Electronic device 512 typically includes a variety of computer system readable media. Such media can be any available media that is accessible by electronic device 512 and includes both volatile and nonvolatile media, removable and non-removable media.

Storage 528 may include computer system readable media in the form of volatile Memory, such as Random Access Memory (RAM) 530 and/or cache Memory 532. The electronic device 512 may further include other removable/non-removable, volatile/nonvolatile computer system storage media. By way of example only, storage system 534 may be used to read from and write to non-removable, nonvolatile magnetic media (not shown in FIG. 10, and commonly referred to as a "hard drive"). Although not shown in FIG. 10, a magnetic disk drive for reading from and writing to a removable, nonvolatile magnetic disk (e.g., a "floppy disk") and an optical disk drive for reading from or writing to a removable, nonvolatile optical disk (e.g., a Compact disk-Read Only Memory (CD-ROM), a Digital Video disk (DVD-ROM), or other optical media) may be provided. In these cases, each drive may be connected to bus 518 through one or more data media interfaces. Storage 528 may include at least one program product having a set (e.g., at least one) of program modules that are configured to carry out the functions of embodiments of the invention.

Program 536 having a set (at least one) of program modules 526 may be stored, for example, in storage 528, such program modules 526 including, but not limited to, an operating system, one or more application programs, other program modules, and program data, each of which examples or some combination may include an implementation of a network environment. Program modules 526 generally perform the functions and/or methodologies of the described embodiments of the invention.

The electronic device 512 may also communicate with one or more external devices 514 (e.g., keyboard, pointing device, camera, display 524, etc.), with one or more devices that enable a user to interact with the electronic device 512, and/or with any devices (e.g., network card, modem, etc.) that enable the electronic device 512 to communicate with one or more other computing devices. Such communication may be through an Input/Output (I/O) interface 522. Also, the electronic device 512 may communicate with one or more networks (e.g., a Local Area Network (LAN), Wide Area Network (WAN), and/or a public Network such as the internet) via the Network adapter 520. As shown, the network adapter 520 communicates with the other modules of the electronic device 512 via the bus 518. It should be appreciated that although not shown, other hardware and/or software modules may be used in conjunction with the electronic device 512, including but not limited to: microcode, device drivers, Redundant processing units, external disk drive Arrays, disk array (RAID) systems, tape drives, and data backup storage systems, to name a few.

The processor 516 executes various functional applications and data processing by executing programs stored in the storage device 528, for example, implementing the device testing method provided by the above embodiment of the present invention: determining at least one test item of a plurality of devices under test; determining the dislocation test sequence of the test items of each device to be tested under the condition that each test item is determined to be a first test item; the test items of the equipment to be tested in the same staggered test sequence are different; and carrying out dislocation test on the test items of the equipment to be tested according to the dislocation test sequence.

EXAMPLE six

An embodiment of the present invention further provides a computer storage medium storing a computer program, where the computer program is used to execute the device testing method according to any one of the above embodiments of the present invention when executed by a computer processor: determining at least one test item of a plurality of devices under test; determining the dislocation test sequence of the test items of each device to be tested under the condition that each test item is determined to be a first test item; the test items of the equipment to be tested in the same staggered test sequence are different; and carrying out dislocation test on the test items of the equipment to be tested according to the dislocation test sequence.

Computer storage media for embodiments of the invention may employ any combination of one or more computer-readable media. The computer readable medium may be a computer readable signal medium or a computer readable storage medium. A computer readable storage medium may be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the foregoing. More specific examples (a non-exhaustive list) of the computer readable storage medium would include the following: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a Read-Only Memory (ROM), an Erasable Programmable Read-Only Memory (EPROM) or flash Memory), an optical fiber, a portable compact disc Read-Only Memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the context of this document, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.

A computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, for example, in baseband or as part of a carrier wave. Such a propagated data signal may take many forms, including, but not limited to, electro-magnetic, optical, or any suitable combination thereof. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.

Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, Radio Frequency (RF), etc., or any suitable combination of the foregoing.

Computer program code for carrying out operations for aspects of the present invention may be written in any combination of one or more programming languages, including an object oriented programming language such as Java, Smalltalk, C + + or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet using an Internet service provider).

It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.

Claims

1. The equipment testing method is applied to an equipment testing system and comprises the following steps:

determining at least one test item of a plurality of devices under test;

determining the dislocation test sequence of the test items of the devices to be tested under the condition that the test items are determined to be the first test items; the test items of the devices to be tested in the same dislocation test sequence are different;

and carrying out dislocation test on the test items of the devices to be tested according to the dislocation test sequence.

2. The method of claim 1, wherein said determining each of said test items to be a first test item comprises:

determining the type of the synchronous test item according to the local configuration data; wherein the local configuration data comprises a category of locally configured target test modules and a number of each of the target test modules;

determining the test item as the first test item if it is determined that the test item does not completely match the synchronous test item type.

3. The method of claim 2, further comprising:

determining the test item of the equipment to be tested as a second test item under the condition that the test item is completely matched with the synchronous test item type;

determining a synchronous test sequence of the test items of the equipment to be tested;

and synchronously testing the test items of the devices to be tested according to the synchronous test sequence.

4. The method of claim 1, wherein said determining the staggered test order of the test items of each of the devices under test comprises:

determining basic synchronous test items included in a basic test link of the equipment to be tested, and distributing a basic synchronous test sequence for the basic synchronous test items; the test items of all the devices to be tested in the same basic synchronous test sequence are the same;

and determining test items included in a non-basic test link of the equipment to be tested, and distributing a staggered test sequence for the test items included in the non-basic test link according to the basic synchronous test sequence.

5. The method of claim 4, wherein after assigning the test items included in the non-base test link with a staggered test order according to the base synchronous test order, further comprising:

sending a low-voltage signal to the device to be tested through a GPIO general input/output pin so as to enable the device to be tested to enter a test state;

and sending a test starting signal to the equipment to be tested according to the dislocation test sequence through a UART universal asynchronous receiving and transmitting transmitter communication mode so as to enable the test items of the equipment to be tested to enter a test state.

6. The method of any of claims 1-5, wherein the device under test comprises a remote control.

7. An equipment testing system, comprising a central control module and a target testing module, wherein:

the central control module is in communication connection with the target test module and is used for determining at least one test item of a plurality of devices to be tested; determining the dislocation test sequence of the test items of the devices to be tested under the condition that the test items are determined to be the first test items; the test items of the devices to be tested in the same dislocation test sequence are different;

and the target testing module is used for carrying out dislocation testing on the testing items of the equipment to be tested according to the dislocation testing sequence.

8. An apparatus testing device, comprising:

the staggered test sequence determining module is used for determining the staggered test sequence of the test items of each device to be tested under the condition that each test item is determined to be a first test item; the test items of the devices to be tested in the same dislocation test sequence are different;

9. An electronic device, characterized in that the electronic device comprises:

one or more processors;

storage means for storing one or more programs;

when executed by the one or more processors, cause the one or more processors to implement the device testing method of any of claims 1-6.

10. A computer storage medium on which a computer program is stored, which program, when being executed by a processor, is adapted to carry out the device testing method of any one of claims 1 to 6.