EP1104663A3 - Eye aberration characteristic measuring apparatus - Google Patents
Eye aberration characteristic measuring apparatus Download PDFInfo
- Publication number
- EP1104663A3 EP1104663A3 EP00124288A EP00124288A EP1104663A3 EP 1104663 A3 EP1104663 A3 EP 1104663A3 EP 00124288 A EP00124288 A EP 00124288A EP 00124288 A EP00124288 A EP 00124288A EP 1104663 A3 EP1104663 A3 EP 1104663A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- light
- illuminating
- optical system
- eye
- condition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 230000004075 alteration Effects 0.000 title abstract 2
- 230000003287 optical effect Effects 0.000 abstract 6
- 210000001525 retina Anatomy 0.000 abstract 2
- 230000001131 transforming effect Effects 0.000 abstract 1
Classifications
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
- A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
- A61B3/1015—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for wavefront analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Medical Informatics (AREA)
- Animal Behavior & Ethology (AREA)
- Biomedical Technology (AREA)
- Heart & Thoracic Surgery (AREA)
- Ophthalmology & Optometry (AREA)
- Molecular Biology (AREA)
- Surgery (AREA)
- Engineering & Computer Science (AREA)
- General Health & Medical Sciences (AREA)
- Public Health (AREA)
- Veterinary Medicine (AREA)
- Biophysics (AREA)
- General Physics & Mathematics (AREA)
- Eye Examination Apparatus (AREA)
Abstract
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP32474499 | 1999-11-15 | ||
JP32474499 | 1999-11-15 | ||
JP2000318640 | 2000-10-18 | ||
JP2000318640A JP4692939B2 (en) | 1999-11-15 | 2000-10-18 | Eye characteristics measuring device |
JP2000321509A JP4618593B2 (en) | 2000-10-20 | 2000-10-20 | Eye characteristics measuring device |
JP2000321509 | 2000-10-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1104663A2 EP1104663A2 (en) | 2001-06-06 |
EP1104663A3 true EP1104663A3 (en) | 2005-01-19 |
Family
ID=27340069
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP00124288A Withdrawn EP1104663A3 (en) | 1999-11-15 | 2000-11-14 | Eye aberration characteristic measuring apparatus |
Country Status (2)
Country | Link |
---|---|
US (1) | US6629761B1 (en) |
EP (1) | EP1104663A3 (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19938203A1 (en) | 1999-08-11 | 2001-02-15 | Aesculap Meditec Gmbh | Method and device for correcting visual defects in the human eye |
EP1157657A4 (en) * | 1999-12-27 | 2007-08-08 | Topcon Corp | Optical characteristic measuring instrument |
JP4606560B2 (en) * | 2000-10-10 | 2011-01-05 | 株式会社トプコン | Ophthalmic optical characteristic measuring device |
JP4630126B2 (en) * | 2005-05-16 | 2011-02-09 | 株式会社トプコン | Ophthalmic optical characteristic measuring device |
US7475989B2 (en) | 2006-03-14 | 2009-01-13 | Amo Manufacturing Usa, Llc | Shack-Hartmann based integrated autorefraction and wavefront measurements of the eye |
WO2008141304A2 (en) | 2007-05-11 | 2008-11-20 | Amo Manufacturing Usa, Llc | Combined wavefront and topography systems and methods |
US7988290B2 (en) | 2007-06-27 | 2011-08-02 | AMO Wavefront Sciences LLC. | Systems and methods for measuring the shape and location of an object |
US7976163B2 (en) * | 2007-06-27 | 2011-07-12 | Amo Wavefront Sciences Llc | System and method for measuring corneal topography |
US7896498B2 (en) * | 2009-03-30 | 2011-03-01 | Ottawa Hospital Research Institute | Apparatus and method for optical measurements |
US8622546B2 (en) | 2011-06-08 | 2014-01-07 | Amo Wavefront Sciences, Llc | Method of locating valid light spots for optical measurement and optical measurement instrument employing method of locating valid light spots |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4222395A1 (en) * | 1992-07-08 | 1994-01-13 | Amtech Ges Fuer Angewandte Mic | Optical system for measuring refraction of eye with light source - has variable imaging optics adjustable in its power of refraction focussing light emanating from light source on retina of eye |
US5777719A (en) * | 1996-12-23 | 1998-07-07 | University Of Rochester | Method and apparatus for improving vision and the resolution of retinal images |
WO1999027334A1 (en) * | 1997-11-21 | 1999-06-03 | Autonomous Technologies Corporation | Objective measurement and correction of optical systems using wavefront analysis |
US5929970A (en) * | 1997-05-13 | 1999-07-27 | Kabushiki Kaisha Topcon | Optical characteristic measuring apparatus |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56151929A (en) * | 1980-04-25 | 1981-11-25 | Canon Inc | Fundus camera |
US6234978B1 (en) * | 1997-02-12 | 2001-05-22 | Kabushiki Kaisha Topcon | Optical characteristic measuring apparatus |
JP2001095760A (en) * | 1999-09-28 | 2001-04-10 | Topcon Corp | Optical characteristic measuring apparatus for eyes |
-
2000
- 2000-11-14 EP EP00124288A patent/EP1104663A3/en not_active Withdrawn
- 2000-11-15 US US09/713,790 patent/US6629761B1/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4222395A1 (en) * | 1992-07-08 | 1994-01-13 | Amtech Ges Fuer Angewandte Mic | Optical system for measuring refraction of eye with light source - has variable imaging optics adjustable in its power of refraction focussing light emanating from light source on retina of eye |
US5777719A (en) * | 1996-12-23 | 1998-07-07 | University Of Rochester | Method and apparatus for improving vision and the resolution of retinal images |
US5929970A (en) * | 1997-05-13 | 1999-07-27 | Kabushiki Kaisha Topcon | Optical characteristic measuring apparatus |
WO1999027334A1 (en) * | 1997-11-21 | 1999-06-03 | Autonomous Technologies Corporation | Objective measurement and correction of optical systems using wavefront analysis |
Also Published As
Publication number | Publication date |
---|---|
EP1104663A2 (en) | 2001-06-06 |
US6629761B1 (en) | 2003-10-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR |
|
AX | Request for extension of the european patent |
Free format text: AL;LT;LV;MK;RO;SI |
|
PUAL | Search report despatched |
Free format text: ORIGINAL CODE: 0009013 |
|
AK | Designated contracting states |
Kind code of ref document: A3 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR |
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AX | Request for extension of the european patent |
Extension state: AL LT LV MK RO SI |
|
17P | Request for examination filed |
Effective date: 20050523 |
|
AKX | Designation fees paid |
Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR |
|
17Q | First examination report despatched |
Effective date: 20050726 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20120605 |