JPS54150082A - Method of drawing pattern with electron beam - Google Patents
Method of drawing pattern with electron beamInfo
- Publication number
- JPS54150082A JPS54150082A JP5906778A JP5906778A JPS54150082A JP S54150082 A JPS54150082 A JP S54150082A JP 5906778 A JP5906778 A JP 5906778A JP 5906778 A JP5906778 A JP 5906778A JP S54150082 A JPS54150082 A JP S54150082A
- Authority
- JP
- Japan
- Prior art keywords
- electron beam
- drawing pattern
- pattern
- electron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Electron Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5906778A JPS54150082A (en) | 1978-05-18 | 1978-05-18 | Method of drawing pattern with electron beam |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5906778A JPS54150082A (en) | 1978-05-18 | 1978-05-18 | Method of drawing pattern with electron beam |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54150082A true JPS54150082A (en) | 1979-11-24 |
Family
ID=13102626
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5906778A Pending JPS54150082A (en) | 1978-05-18 | 1978-05-18 | Method of drawing pattern with electron beam |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54150082A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0458104A (en) * | 1990-06-27 | 1992-02-25 | Hitachi Ltd | Electron beam size measuring instrument |
JP2005032838A (en) * | 2003-07-08 | 2005-02-03 | Canon Inc | Method and device for charged particle beam lithography and method of manufacturing device |
-
1978
- 1978-05-18 JP JP5906778A patent/JPS54150082A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0458104A (en) * | 1990-06-27 | 1992-02-25 | Hitachi Ltd | Electron beam size measuring instrument |
JP2005032838A (en) * | 2003-07-08 | 2005-02-03 | Canon Inc | Method and device for charged particle beam lithography and method of manufacturing device |
JP4494734B2 (en) * | 2003-07-08 | 2010-06-30 | キヤノン株式会社 | Charged particle beam drawing method, charged particle beam exposure apparatus, and device manufacturing method |
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